In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
نویسندگان
چکیده
منابع مشابه
Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging
The removal of a thinned lamella from a bulk sample for Transmission Electron Microscopy (TEM) analysis has been possible in the Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for over 20 years either via in situ (by use of a micromanipulator) or ex situ lift-out approaches [1]. Both offer swift, site specific preparation for TEM analysis, particularly in light of advancements in corre...
متن کاملA novel cryo-FIB lift-out procedure for cryo-TEM sample preparation
The focused-ion-beam (FIB) is the method of choice for site-specific sample preparation for Transmission Electron Microscopy (TEM) in material sciences. A lamella can be physically lifted out from a specific region of a bulk specimen with submicrometer precision and thinned to electron transparency for high-resolution imaging in the TEM. The possibility to use this tool in life sciences applica...
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Inductively coupled plasma sources are capable of producing Xe + ions for commercial focused ion beam (FIB) applications [1,2]. It should be no surprise that the longstanding Ga + FIB strategies for transmission electron microscopy (TEM) specimen preparation are directly applicable and transferrable to the plasma FIB (PFIB). Indeed, we showed a few years ago that the Xe + PFIB can produce elect...
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Transmission electron microscopy (TEM) is a powerful tool for the investigation of the microstructure of materials, providing crystallographic information and composition at the nanometer scale. For such studies, samples should be transparent to the electron beam. In this review, TEM sample preparation techniques for different classes of materials, such as metals and alloys, multilayered coatin...
متن کاملTEM Sample Preparation and FIB-Induced Damage
Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino, and Joseph Michael preparation can be applied to almost any material type—hard, soft, or combinations thereof. The number of materials for which successful TEM sample preparation with FIBs has been documented certainly reaches several hundred and spans from hard matter such as metals, ceramics, and composites to soft matter including polymers, ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2002
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927602100717